Impact of Postplating Annealing on Defect Activation in Boron-Doped PERC Solar Cells
| Autor: | Tim Niewelt, Benjamin Grubel, Sebastian Roder, Sven Kluska, Georg Christopher Theil |
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| Přispěvatelé: | Publica |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
business.industry Annealing (metallurgy) 0211 other engineering and technologies 02 engineering and technology Atmospheric temperature range 021001 nanoscience & nanotechnology Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention Silicium-Photovoltaik law Photovoltaik Solar cell Boron doping Optoelectronics 021108 energy Electrical and Electronic Engineering 0210 nano-technology business Metallisierung und Strukturierung Common emitter |
| Zdroj: | IEEE Journal of Photovoltaics. 10:444-448 |
| ISSN: | 2156-3403 2156-3381 |
| DOI: | 10.1109/jphotov.2020.2968110 |
| Popis: | In this article, the impact of postplating annealing on the regenerated state of boron-doped p-type passivated emitter and rear cell (PERC) solar cells with plated Ni/Cu/Ag front-side contacts is characterized. The assessment of different plating annealing profiles in the temperature range of 200-300 °C and their impact on light-induced degradation as well as on additional defects are realized by lifetime measurements of nonmetallized solar cell precursors before and after annealing. An observed lifetime degradation indicates that the current process sequence might facilitate bulk defect activation. An alternative process sequence is tested and promising results are presented. |
| Databáze: | OpenAIRE |
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