Atomic resolution force microscopy imaging on a strongly ionic surface with differently functionalized tips
| Autor: | Michael Reichling, L. Tröger, S Gritschneder, Toyoko Arai |
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| Jazyk: | angličtina |
| Rok vydání: | 2010 |
| Předmět: |
Materials science
Silicon business.industry Process Chemistry and Technology Analytical chemistry Ionic bonding chemistry.chemical_element Dielectric Conductive atomic force microscopy Fluorite Surfaces Coatings and Films Electronic Optical and Magnetic Materials Condensed Matter::Materials Science chemistry.chemical_compound chemistry Microscopy Physics::Atomic and Molecular Clusters Materials Chemistry Optoelectronics Electrical and Electronic Engineering business Instrumentation Fluoride Nanopillar |
| Zdroj: | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 28(6):1279-1283 |
| ISSN: | 1071-1023 |
| Popis: | 金沢大学理工研究域数物科学系 Three types of tips for noncontact atomic force microscopy imaging, namely, a silicon nanopillar tip, a carbon nanopillar tip, and a fluoride cluster tip, are prepared for atomic resolution imaging on the CaF2 (111) surface. The most enhanced atomic corrugation is obtained with the fluoride cluster tip prepared by gently touching the fluorite surface. Atom resolved images are much harder to obtain with the other tips. This demonstrates the importance of having a polar tip for atomic resolution imaging of an ionic surface and supports the general notion that a surface is best imaged with a tip of the same material. © 2010 American Vacuum Society. |
| Databáze: | OpenAIRE |
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