Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline
| Autor: | David Vine, Martin D. de Jonge, Brian Abbey, Michael W. M. Jones, R. Kirkham, Grant van Riessen, Nader Afshar, Stephen T. Mudie, Bo Chen, Nicholas W. Phillips, Youssef S. G. Nashed, Eugeniu Balaur |
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| Rok vydání: | 2016 |
| Předmět: |
Diffraction
Nuclear and High Energy Physics Radiation Materials science Analytical chemistry X-ray fluorescence 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Ptychography Beamline 0103 physical sciences Microscopy X-ray crystallography Fluorescence microscope 010306 general physics 0210 nano-technology Australian Synchrotron Instrumentation |
| Zdroj: | Journal of Synchrotron Radiation. 23:1151-1157 |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/s1600577516011917 |
| Popis: | Owing to its extreme sensitivity, quantitative mapping of elemental distributionsviaX-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated. |
| Databáze: | OpenAIRE |
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