Post-sample aperture for low background diffraction experiments at X-ray free-electron lasers
| Autor: | Wiedorn, Max O., Awel, Salah, Morgan, Andrew, Barthelmess, Miriam, Bean, Richard, Beyerlein, Kenneth R., Chavas, Leonard M. G., Eckerskorn, Niko, Fleckenstein, Holger, Heymann, Michael, Horke, Daniel, Knoska, Juraj, Mariani, Valerio, Oberth��r, Dominik, Roth, Nils, Yefanov, Oleksandr, Barty, Anton, Bajt, Sa��a, K��pper, Jochen, Rode, Andrei V., Kirian, Richard A., Chapman, Henry N. |
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| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: | |
| Zdroj: | Journal of Synchrotron Radiation Journal of synchrotron radiation 24(6), 1296-1298 (2017). doi:10.1107/S1600577517011961 |
| ISSN: | 1600-5775 |
| DOI: | 10.3204/pubdb-2017-11182 |
| Popis: | Journal of synchrotron radiation 24(6), 1296 - 1298 (2017). doi:10.1107/S1600577517011961 The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal-to-noise ratio. This is particularly important in single-particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce backgroundscattering by placing an aperture downstream of the sample has been developed and its application in a single-particle X-ray imaging experiment at FLASH is demonstrated. Using the concept of a post-sample aperture it was possible to reduce the background scattering levels by two orders of magnitude. Published by IUCr, Chester |
| Databáze: | OpenAIRE |
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