Autor:	Robert Crane, George N. Steinberg, P. H. Langenbeck, Harry D. Polster, Jose Pastor, Roderic M. Scott, Robert G. Pilston
Rok vydání:	2010
Předmět:	Interferometry Engineering Optics business.industry Materials Science (miscellaneous) Library science Nanotechnology Business and International Management business Industrial and Manufacturing Engineering Laser beams
Zdroj:	Applied optics. 8(3)
ISSN:	1559-128X
Popis:	This article is based on a series of talks presented by personnel of The Perkin-Elmer Corporation at a symposium held in September 1967 and thereafter brought up to date for inclusion in the APPLIED OPTICS feature discussing Interferometry vs Spectroscopy.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::537f498880824bc2f41c0691b6e496cd https://pubmed.ncbi.nlm.nih.gov/20072256 Zobrazit plný text záznamu