An optoelectronic defect detection method and system insensitive to yarn speed
| Autor: | Eldar Musayev |
|---|---|
| Přispěvatelé: | Uludağ Üniversitesi/Mühendislik Fakültesi/Elektrik-Elektronik Mühendisliği Bölümü., Musayev, Eldar |
| Jazyk: | angličtina |
| Rok vydání: | 2004 |
| Předmět: |
Signal processing
Light emitter Materials science Speed control Speed Optoelectronic devices law.invention Optics law Shadow Yarn Defection Optoelectronics Operational amplifiers Microprocessor chips business.industry Diagram Optical methods Photodetectors Hairiness Yarns Evenness Pulse duration Noisy knot defects Atomic and Molecular Physics and Optics Light emitting diodes Microprocessor visual_art Asymmetric noisy half defects visual_art.visual_art_medium Defects Defect business Pulse-width modulation |
| Popis: | Analysis of optical methods and systems used to detect defects of a yarn, e.g.?chenille yarn which will simply be called yarn throughout the paper, indicates that the detection results in current methods and systems depend on the yarn speed. In this paper, we report on an optical diagram with a wide-angled light emitter that has been developed to show the optical method of defect detection. The equation expressing the difference between the real defect length and the shadow length or detected defect length formed on the detection surface is obtained. An experimental setup has been developed to examine the variation of the pulse duration?formed by the defect?with the speed, and results are given in graphical form. Finally, a two-detector method and a microprocessor based system insensitive to yarn speed has been developed. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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