Study of the microstructure of amorphous silica nanostructures using high-resolution electron microscopy, electron energy loss spectroscopy, X-ray powder diffraction, and electron pair distribution function

Autor: Viktória Kovács Kis, Partha Pratim Das, Lahcen khouchaf, János L. Lábár, Stavros Nicolopoulos, Khalid Boulahya
Přispěvatelé: Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université de Strasbourg (UNISTRA)-Matériaux et nanosciences d'Alsace (FMNGE), Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Institut National de la Santé et de la Recherche Médicale (INSERM)-Centre National de la Recherche Scientifique (CNRS)-Centre National de la Recherche Scientifique (CNRS)-Réseau nanophotonique et optique, Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA)-Université de Haute-Alsace (UHA) Mulhouse - Colmar (Université de Haute-Alsace (UHA))-Centre National de la Recherche Scientifique (CNRS)-Université de Strasbourg (UNISTRA), Unité de Mécanique de Lille - ULR 7512 (UML), Université de Lille
Jazyk: angličtina
Rok vydání: 2020
Předmět:
spectroscopy
Materials science
Silicon
amorphous silica
Analytical chemistry
chemistry.chemical_element
powder diffraction
02 engineering and technology
high-resolution
01 natural sciences
lcsh:Technology
Article
[SPI]Engineering Sciences [physics]
0103 physical sciences
transmission electron microscopy
General Materials Science
Spectroscopy
High-resolution transmission electron microscopy
lcsh:Microscopy
electron pair distribution function
lcsh:QC120-168.85
010302 applied physics
lcsh:QH201-278.5
lcsh:T
Electron energy loss spectroscopy
021001 nanoscience & nanotechnology
Amorphous solid
electron diffraction
chemistry
Electron diffraction
Transmission electron microscopy
lcsh:TA1-2040
lcsh:Descriptive and experimental mechanics
lcsh:Electrical engineering. Electronics. Nuclear engineering
0210 nano-technology
lcsh:Engineering (General). Civil engineering (General)
lcsh:TK1-9971
Powder diffraction
Zdroj: Materials
Materials, 2020, 13 (19), pp.1-14. ⟨10.3390/ma13194393⟩
Materials, Vol 13, Iss 4393, p 4393 (2020)
Materials, 2020, 13 (19), pp.4393. ⟨10.3390/ma13194393⟩
Materials; Volume 13; Issue 19; Pages: 4393
ISSN: 1996-1944
Popis: Silica has many industrial (i.e., glass formers) and scientific applications. The understanding and prediction of the interesting properties of such materials are dependent on the knowledge of detailed atomic structures. In this work, amorphous silica subjected to an accelerated alkali silica reaction (ASR) was recorded at different time intervals so as to follow the evolution of the structure by means of high-resolution transmission electron microscopy (HRTEM), electron energy loss spectroscopy (EELS), and electron pair distribution function (e-PDF), combined with X-ray powder diffraction (XRPD). An increase in the size of the amorphous silica nanostructures and nanopores was observed by HRTEM, which was accompanied by the possible formation of Si–OH surface species. All of the studied samples were found to be amorphous, as observed by HRTEM, a fact that was also confirmed by XRPD and e-PDF analysis. A broad diffuse peak observed in the XRPD pattern showed a shift toward higher angles following the higher reaction times of the ASR-treated material. A comparison of the EELS spectra revealed varying spectral features in the peak edges with different reaction times due to the interaction evolution between oxygen and the silicon and OH ions. Solid-state nuclear magnetic resonance (NMR) was also used to elucidate the silica nanostructures. © 2020 by the authors. Licensee MDPI, Basel, Switzerland.
Databáze: OpenAIRE
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