Coherent x-ray scattering in an XPEEM setup
| Autor: | Andrea Locatelli, V. Schánilec, Nicolas Rougemaille, Francesca Genuzio, Jakub Sadílek, Tevfik Onur Menteş |
|---|---|
| Přispěvatelé: | Elettra Sincrotrone Trieste, Micro et NanoMagnétisme (MNM), Institut Néel (NEEL), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Brno University of Technology [Brno] (BUT) |
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Materials science
reconstruction resonant x-ray scattering 02 engineering and technology 01 natural sciences Speckle pattern Optics Lattice (order) 0103 physical sciences Instrumentation LEEM 010302 applied physics Scattering business.industry X-ray XPEEM 021001 nanoscience & nanotechnology Reconstruction method Coherent diffraction imaging Atomic and Molecular Physics and Optics Charged particle Electronic Optical and Magnetic Materials Photoemission electron microscopy [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] speckle CDI 0210 nano-technology business |
| Zdroj: | Ultramicroscopy Ultramicroscopy, Elsevier, 2020, 216, pp.113035. ⟨10.1016/j.ultramic.2020.113035⟩ |
| ISSN: | 0304-3991 |
| Popis: | X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect