Application of the concept of effective refractive index to the measurement of thickness distributions of dielectric films
| Autor: | P. H. Lissberger, D. Keay |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Interference filter
Materials science business.industry Materials Science (miscellaneous) Physics::Optics Dielectric Industrial and Manufacturing Engineering Condensed Matter::Materials Science Wavelength Optics Attenuation coefficient Optical depth (astrophysics) Transmittance Business and International Management Step-index profile business Refractive index |
| Zdroj: | Applied optics. 6(4) |
| ISSN: | 1559-128X |
| Popis: | In the method to be described, the dielectric film is deposited between two silver films so that the three-layer system constitutes a Fabry–Perot interference filter. It is shown how measurements of the variation of the wavelength of peak transmittance over the surface of the filter can be combined with a measurement of the effective refractive index to obtain precise values of the distribution of relative geometrical thickness of the dielectric spacing layer. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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