Combined Ion Conductance and Atomic Force Microscope for Fast Simultaneous Topographical and Surface Charge Imaging
| Autor: | Hana Han, Dmitry Momotenko, Tomaso Zambelli, Morteza Aramesh, Livie Dorwling-Carter |
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| Přispěvatelé: | University of Zurich, Momotenko, Dmitry |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
1602 Analytical Chemistry
Cantilever Pixel business.industry Chemistry Conductance Ion current 610 Medicine & health 02 engineering and technology Electrolyte 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Ion Analytical Chemistry 170 Ethics Rectification Optoelectronics 10237 Institute of Biomedical Engineering Surface charge 0210 nano-technology business |
| Zdroj: | Analytical Chemistry, 90 (19) |
| ISSN: | 1520-6882 0003-2700 |
| Popis: | Analytical Chemistry, 90 (19) ISSN:1520-6882 ISSN:0003-2700 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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