Emotion Recognition and Adverse Childhood Experiences in Individuals at Clinical High Risk of Psychosis

Autor: Merete Nordentoft, Ana Catalan, Marie-Odile Krebs, Mark van der Gaag, Christos Pantelis, Lieuwe de Haan, Lucia Valmaggia, Matthew J. Kempton, Philip McGuire, Barnaby Nelson, Gabriele Sachs, Anita Riecher-Rössler, Stephan Ruhrmann, Neus Barrantes-Vidal, Rodrigo A. Bressan, Jim van Os, Bart P. F. Rutten, Stefania Tognin, Amaia Bilbao, Gemma Modinos, Eu-Gei High Risk Study
Přispěvatelé: Adult Psychiatry, Amsterdam Neuroscience - Mood, Anxiety, Psychosis, Stress & Sleep, APH - Mental Health, MUMC+: MA Psychiatrie (3), Psychiatrie & Neuropsychologie, RS: MHeNs - R3 - Neuroscience, RS: MHeNs - R2 - Mental Health, MUMC+: Hersen en Zenuw Centrum (3), Clinical Psychology
Jazyk: angličtina
Rok vydání: 2020
Předmět:
Male
childhood adversities
FACIAL AFFECT RECOGNITION
Logistic regression
1ST-EPISODE SCHIZOPHRENIA
Adverse Childhood Experiences
DEFICITS
1ST-DEGREE RELATIVES
Medicine
Child Abuse
Emotion recognition
Psychological abuse
TRAUMA
emotional processing
Facial affect
vulnerability to psychosis
Justice and Strong Institutions
Psychiatry and Mental health
Social Perception
MENTAL STATE
Female
Disease Susceptibility
recognition
Facial Recognition
BULLYING VICTIMIZATION
ULTRA-HIGH-RISK
TRANSITION
Clinical psychology
Adult
Risk
Psychosis
SDG 16 - Peace
Adolescent
Emotional processing
Young Adult
PEOPLE
Humans
facial affect
Association (psychology)
business.industry
psychosis risk
SDG 16 - Peace
Justice and Strong Institutions
Bullying
medicine.disease
Psychotic Disorders
business
Regular Articles
Follow-Up Studies
Zdroj: Schizophrenia bulletin, 46(4), 823-833. Oxford University Press
Schizophr Bull
Schizophrenia Bulletin, 46(4), 823-833. Oxford University Press
EU-GEI High Risk Study 2020, ' Emotion Recognition and Adverse Childhood Experiences in Individuals at Clinical High Risk of Psychosis ', Schizophrenia bulletin, vol. 46, no. 4, pp. 823-833 . https://doi.org/10.1093/schbul/sbz128
ISSN: 1745-1701
0586-7614
Popis: ObjectiveTo investigate the association between facial affect recognition (FAR) and type of adverse childhood experiences (ACEs) in a sample of clinical high risk (CHR) individuals and a matched sample of healthy controls (HCs).MethodsIn total, 309 CHR individuals and 51 HC were recruited as part of an European Union-funded multicenter study (EU-GEI) and included in this work. During a 2-year follow-up period, 65 CHR participants made a transition to psychosis (CHR-T) and 279 did not (CHR-NT). FAR ability was measured using a computerized version of the Degraded Facial Affect Recognition (DFAR) task. ACEs were measured using the Childhood Experience of Care and Abuse Questionnaire, the Childhood Trauma Questionnaire, and the Bullying Questionnaire. Generalized regression models were used to investigate the relationship between ACE and FAR. Logistic regressions were used to investigate the relationship between FAR and psychotic transition.ResultsIn CHR individuals, having experienced emotional abuse was associated with decreased total and neutral DFAR scores. CHR individuals who had experienced bullying performed better in the total DFAR and in the frightened condition. In HC and CHR, having experienced the death of a parent during childhood was associated with lower DFAR total score and lower neutral DFAR score, respectively. Analyses revealed a modest increase of transition risk with increasing mistakes from happy to angry faces.ConclusionsAdverse experiences in childhood seem to have a significant impact on emotional processing in adult life. This information could be helpful in a therapeutic setting where both difficulties in social interactions and adverse experiences are often addressed.
Databáze: OpenAIRE
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