A utilization of the phase spectrum for the correction of image drift in high resolution transmission electron microscopy

Autor:	Norio Baba, Norihiko Ichise, Mitsuo Ogasawara
Rok vydání:	1995
Předmět:	Conventional transmission electron microscope Histology Materials science Fourier Analysis business.industry Resolution (electron density) Scanning confocal electron microscopy Medical Laboratory Technology Microscopy Electron Optics Electron tomography Phase spectrum Scanning transmission electron microscopy Image Processing Computer-Assisted Energy filtered transmission electron microscopy Anatomy High-resolution transmission electron microscopy business Instrumentation
Zdroj:	Microscopy research and technique. 30(4)
ISSN:	1059-910X
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::504d3d26c880d5a216cffc759a0fdcb6 https://pubmed.ncbi.nlm.nih.gov/7606053 Zobrazit plný text záznamu Plný text