160Gb/s Serial Line Rates in a Monolithic Optoelectronic Multistage Interconnection Network

Autor:	Ys Oei, LM Luc Augustin, Martijn J. R. Heck, Fausto Gomez-Agis, R Richard Nötzel, D.J. Robbins, Xaveer Leijtens, Aaron Albores-Mejia, T. de Vries, MK Meint Smit, H.J.S. Dorren, S. Zhang, Kevin A. Williams
Přispěvatelé:	Electro-Optical Communication, Photonic Integration, Photonics and Semiconductor Nanophysics
Rok vydání:	2009
Předmět:	Optical amplifier Interconnection business.industry Computer science Electronic engineering Bit error rate Circuit complexity Telecommunications business Optical switch Multiplexing Data transmission Electronic circuit
Zdroj:	Hot Interconnects Proceedings of the 17th Annual IEEE Symposium on High-Performance Interconnects, 25-27 August 2009, 157-162 STARTPAGE=157;ENDPAGE=162;TITLE=Proceedings of the 17th Annual IEEE Symposium on High-Performance Interconnects, 25-27 August 2009
DOI:	10.1109/hoti.2009.10
Popis:	We demonstrate very high line rate serial 160 Gb/s data transmission through a semiconductor optical amplifier based multistage switching matrix. This represents both the leading edge in monolithic switching circuit complexity and the highest reported line rates through monolithically cascaded switching networks. Bit error rate studies are performed to show only modest levels of signal degradation. Power penalties of order 0.6 dB and 1.2 dB are observed for two stages and four stages respectively in the monolithic circuits at 160 Gb/s per path.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4f46d20217614d8a1d078f3120324e91 https://doi.org/10.1109/hoti.2009.10 Zobrazit plný text záznamu