Three-Dimensional X-Ray Microtomography
| Autor: | Kevin L. D'amico, Wayne G. Roberge, Harry W. Deckman, Brian P. Flannery |
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| Rok vydání: | 1987 |
| Předmět: | |
| Zdroj: | Science. 237:1439-1444 |
| ISSN: | 1095-9203 0036-8075 |
| DOI: | 10.1126/science.237.4821.1439 |
| Popis: | The new technique of x-ray microtomography nondestructively generates three-dimensional maps of the x-ray attenuation coefficient inside small samples with approximately 1 percent accuracy and with resolution approaching 1 micrometer. Spatially resolved elemental maps can be produced with synchrotron x-ray sources by scanning samples at energies just above and below characteristic atomic absorption edges. The system consists of a high-resolution imaging x-ray detector and high-speed algorithms for tomographic image reconstruction. The design and operation of the microtomography device are described, and tomographic images that illustrate its performance with both synchrotron and laboratory x-ray sources are presented. |
| Databáze: | OpenAIRE |
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