SPICE Modeling of Photoelectric Effects in Silicon With Generalized Devices

Autor: Jean-Michel Sallese, Chiara Rossi, Pietro Buccella, Camillo Stefanucci
Rok vydání: 2018
Předmět:
Zdroj: IEEE Journal of the Electron Devices Society, Vol 6, Pp 987-995 (2018)
ISSN: 2168-6734
DOI: 10.1109/jeds.2018.2817286
Popis: Modeling photoelectric effects in semiconductors with electrical simulators is demonstrated in typical 1-D and 2-D architectures. The concept is based on a coarse meshing of the semiconductor with the so-called generalized lumped devices, where equivalent voltages and currents are used in place of minority carrier excess concentrations and minority carrier gradients, respectively, and where the light-induced excess carrier concentration in silicon is introduced by means of internal current sources. Generation, propagation, and collection of these minority carriers are analyzed for different structures which can behave as photosensors or solar cells. Both static and transient operations are found in good agreement with TCAD numerical simulations while using the same physical and geometrical parameters.
Databáze: OpenAIRE