Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission
Autor: | H. Sykulska, Urs Staufer, N. F. de Rooij, D. Parrat, S. Vijendran, Sebastian Gautsch, J. M. Marookian, Michael H. Hecht, William T. Pike |
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Jazyk: | angličtina |
Rok vydání: | 2017 |
Předmět: | |
Zdroj: | Microscopy and Microanalysis, 17 (Suppl. 2), 2011 |
ISSN: | 1435-8115 |
Popis: | 1 SAMLAB, EPFL STI, Jaquet-Droz 1, 2002 Neuchatel, Switzerland 2 MNE Laboratory, TU Delft, Mekelweg 2, 2628 CD Delft, The Netherlands; u.staufer@tudelt.nl 3 Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109 4 ESTEC, Keplerlaan 1 Postbus 299, 2200 AG Noordwijk, The Netherlands 5 Dept. of Electrical and Electronic Eng., Imperial College, South Kensington Campus, London SW7 2AZ, UK |
Databáze: | OpenAIRE |
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