Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission

Autor: H. Sykulska, Urs Staufer, N. F. de Rooij, D. Parrat, S. Vijendran, Sebastian Gautsch, J. M. Marookian, Michael H. Hecht, William T. Pike
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Zdroj: Microscopy and Microanalysis, 17 (Suppl. 2), 2011
ISSN: 1435-8115
Popis: 1 SAMLAB, EPFL STI, Jaquet-Droz 1, 2002 Neuchatel, Switzerland 2 MNE Laboratory, TU Delft, Mekelweg 2, 2628 CD Delft, The Netherlands; u.staufer@tudelt.nl 3 Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109 4 ESTEC, Keplerlaan 1 Postbus 299, 2200 AG Noordwijk, The Netherlands 5 Dept. of Electrical and Electronic Eng., Imperial College, South Kensington Campus, London SW7 2AZ, UK
Databáze: OpenAIRE