Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors
| Autor: | Manuel Dominguez-Pumar, Chenna Reddy Bheesayagari, Gema Lopez-Rodriguez, Sergi Gorreta, Joan Pons-Nin |
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| Přispěvatelé: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions, Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies |
| Rok vydání: | 2018 |
| Předmět: |
Ionizing radiation
Materials science Capacitance Radiation effects Charge trapping control 02 engineering and technology Dielectric Radiation 01 natural sciences Industrial electronics law.invention law MIS capacitors 0103 physical sciences Charge control 0202 electrical engineering electronic engineering information engineering Irradiation Electrical and Electronic Engineering CDielectrics Metal oxide semiconductors Modulation MOS capacitors 010308 nuclear & particles physics business.industry Capacitance-voltage characteristics Sigma-delta modulation Física::Física de l'estat sòlid::Semiconductors [Àrees temàtiques de la UPC] 020208 electrical & electronic engineering Charge (physics) Metall-òxid-semiconductors Capacitor Control and Systems Engineering Optoelectronics business Electrònica industrial |
| Zdroj: | UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) Recercat. Dipósit de la Recerca de Catalunya instname |
| ISSN: | 1557-9948 0278-0046 |
| Popis: | The objective of this paper is to explore the capability of a charge trapping control loop to continuously compensate charge induced by ionizing radiation in the dielectric of metal–oxide–semiconductor (MOS) capacitors. To this effect, two devices made with silicon oxide have been simultaneously irradiated with gamma radiation: one with constant voltage bias and the other working under a dielectric charge control. The experiment shows substantial charge trapping in the uncontrolled device, whereas, at the same time, the control loop is able to compensate the charge induced by gamma radiation in the second device. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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