Surface Measurement Using Compressed Wavefront Sensing
| Autor: | Xin Wang, Eddy Mun Tik Chow, Ningqun Guo, Edwin K. P. Chong |
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| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
lcsh:Applied optics. Photonics
Computer science Acoustics 02 engineering and technology 01 natural sciences 010309 optics symbols.namesake 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Demodulation Sensitivity (control systems) Shack–Hartmann wavefront sensor compressed sensing Wavefront Dynamic range Shack-Hartmann wavefront sensor lcsh:TA1501-1820 Wavefront sensor ComputerSystemsOrganization_PROCESSORARCHITECTURES Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Fourier transform Compressed sensing symbols 020201 artificial intelligence & image processing surface measurement |
| Zdroj: | Photonic Sensors, Vol 9, Iss 2, Pp 115-125 (2018) |
| ISSN: | 2190-7439 1674-9251 |
| Popis: | Compressed sensing leverages the sparsity of signals to reduce the amount of measurements required for its reconstruction. The Shack-Hartmann wavefront sensor meanwhile is a flexible sensor where its sensitivity and dynamic range can be adjusted based on applications. An investigation is done by using compressed sensing in surface measurements with the Shack-Hartmann wavefront sensor. The results show that compressed sensing paired with the Shack-Hartmann wavefront sensor can reliably measure surfaces accurately. The performance of compressed sensing is compared with those of the iterative modal-based wavefront reconstruction and Fourier demodulation of Shack-Hartmann spot images. Compressed sensing performs comparably to the modal based iterative wavefront reconstruction in both simulation and experiment while performing better than the Fourier demodulation in simulation. |
| Databáze: | OpenAIRE |
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