Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer
| Autor: | Wolfgang S. M. Werner, Ivo Konvalina, Luděk Frank, Tomáš Radlička, Lukáš Průcha, Jakub Piňos, Benjamin Daniel, Martin Zouhar, Ilona Müllerová, Eliška Mikmeková, Aleš Paták |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Materials science
Graphene General Chemical Engineering band structure graphene energy-loss spectrum Electron many-body perturbation theory Inelastic mean free path time-of-flight spectrometer Article law.invention Chemistry Time of flight law density of states Density of states General Materials Science Density functional theory inelastic mean free path Atomic physics Electronic band structure density-functional theory QD1-999 Electron scattering |
| Zdroj: | Nanomaterials Volume 11 Issue 9 Nanomaterials, Vol 11, Iss 2435, p 2435 (2021) |
| ISSN: | 2079-4991 |
| DOI: | 10.3390/nano11092435 |
| Popis: | The detailed examination of electron scattering in solids is of crucial importance for the theory of solid-state physics, as well as for the development and diagnostics of novel materials, particularly those for micro- and nanoelectronics. Among others, an important parameter of electron scattering is the inelastic mean free path (IMFP) of electrons both in bulk materials and in thin films, including 2D crystals. The amount of IMFP data available is still not sufficient, especially for very slow electrons and for 2D crystals. This situation motivated the present study, which summarizes pilot experiments for graphene on a new device intended to acquire electron energy-loss spectra (EELS) for low landing energies. Thanks to its unique properties, such as electrical conductivity and transparency, graphene is an ideal candidate for study at very low energies in the transmission mode of an electron microscope. The EELS are acquired by means of the very low-energy electron microspectroscopy of 2D crystals, using a dedicated ultra-high vacuum scanning low-energy electron microscope equipped with a time-of-flight (ToF) velocity analyzer. In order to verify our pilot results, we also simulate the EELS by means of density functional theory (DFT) and the many-body perturbation theory. Additional DFT calculations, providing both the total density of states and the band structure, illustrate the graphene loss features. We utilize the experimental EELS data to derive IMFP values using the so-called log-ratio method. |
| Databáze: | OpenAIRE |
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