RBS and NRA analyses of lithium inserted amorphous Li1+xNiVO4 films
| Autor: | Brigitte Pecquenard, M. V. Reddy, C. Wannek, Philippe Vinatier, Philippe Moretto, Alain Levasseur |
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| Přispěvatelé: | Institut de Chimie de la Matière Condensée de Bordeaux (ICMCB), Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université de Bordeaux (UB), Centre d'Etudes Nucléaires de Bordeaux Gradignan (CENBG), Université Sciences et Technologies - Bordeaux 1-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS) |
| Rok vydání: | 2006 |
| Předmět: |
Nuclear and High Energy Physics
Auger electron spectroscopy Materials science Ion beam Oxide Analytical chemistry [CHIM.MATE]Chemical Sciences/Material chemistry 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Amorphous solid NRA chemistry.chemical_compound Li-insertion chemistry Nuclear reaction analysis Surface roughness Thin film 0210 nano-technology Spectroscopy Instrumentation RBS LiNiVO4 films |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2006, vol. 246, n° 2, p. 397-401. ⟨10.1016/j.nimb.2005.12.055⟩ |
| ISSN: | 0168-583X |
| DOI: | 10.1016/j.nimb.2005.12.055 |
| Popis: | International audience; rf-Magnetron sputtered LiNiVO4 thin film was used as a negative electrode for lithium microbatteries applications. Their film composition and thickness were analyzed by Rutherford backscattering spectroscopy (RBS) and nuclear reaction analysis (NRA) technique by using 4He+, 7Li(p α) 4He reaction respectively. The structure, surface roughness and homogeneity of these films have been investigated by X-ray diffraction (XRD), atomic force microscopy (AFM) and auger electron spectroscopy (AES) techniques. The amount of lithium inserted into the LiNiVO4 films was analyzed by RBS and NRA studies. The results are comparable to those obtained from the electro-analytical technique (galvanostatic method), indicating that ion beam techniques are complementary tools for the analysis of lithium metal oxide thin films. |
| Databáze: | OpenAIRE |
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