Understanding the relationship between current loss and load hardware geometry in Z machine experiments

Autor:	Dana Zimmer, Clayton E. Myers, Christopher Jennings, F. Conti, Matthew R. Gomez, F. N. Beg
Rok vydání:	2021
Předmět:	Computer science Electronic engineering Current (fluid)
Zdroj:	Proposed for presentation at the Center for Matter Under Extreme Conditions Meeting held May 12, 2021 in virtual, virtual, virtual..
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4aefc46866fb743340487f11922409fa https://doi.org/10.2172/1867998 Zobrazit plný text záznamu