Deep Learning-Based Regression and Classification for Automatic Landmark Localization in Medical Images

Autor: Richard A.P. Takx, Max A. Viergever, Elbrich M. Postma, Bob D. de Vos, Jelmer M. Wolterink, Tim Leiner, Ivana Išgum, Julia M. H. Noothout, Paul A.M. Smeets
Přispěvatelé: Biomedical Engineering and Physics, Graduate School, ACS - Atherosclerosis & ischemic syndromes, Radiology and Nuclear Medicine, ANS - Brain Imaging, ACS - Heart failure & arrhythmias, Applied Analysis
Jazyk: angličtina
Rok vydání: 2020
Předmět:
FOS: Computer and information sciences
Computer science
Computer Vision and Pattern Recognition (cs.CV)
Computer Science - Computer Vision and Pattern Recognition
FOS: Physical sciences
convolutional neural network
cardiac CT
Convolutional neural network
Displacement (vector)
030218 nuclear medicine & medical imaging
03 medical and health sciences
0302 clinical medicine
cephalometric X-ray
FOS: Electrical engineering
electronic engineering
information engineering

Electrical and Electronic Engineering
Sensory Science and Eating Behaviour
VLAG
Landmark
Radiological and Ultrasound Technology
Artificial neural network
business.industry
Deep learning
Image and Video Processing (eess.IV)
22/2 OA procedure
Reproducibility of Results
deep learning
Pattern recognition
Electrical Engineering and Systems Science - Image and Video Processing
Physics - Medical Physics
Regression
Computer Science Applications
Sensoriek en eetgedrag
Kernel (image processing)
classification
olfactory MR
Landmark localization
regression
Artificial intelligence
Medical Physics (physics.med-ph)
Neural Networks
Computer

Anatomic Landmarks
business
Software
Algorithms
Zdroj: IEEE Transactions on Medical Imaging, 39(12), 4011-4022
IEEE transactions on medical imaging, 39(12):9139480, 4011-4022. Institute of Electrical and Electronics Engineers Inc.
IEEE Transactions on Medical Imaging 39 (2020) 12
IEEE transactions on medical imaging, 39(12):9139480, 4011-4022. IEEE
ISSN: 0278-0062
DOI: 10.1109/tmi.2020.3009002
Popis: In this study, we propose a fast and accurate method to automatically localize anatomical landmarks in medical images. We employ a global-to-local localization approach using fully convolutional neural networks (FCNNs). First, a global FCNN localizes multiple landmarks through the analysis of image patches, performing regression and classification simultaneously. In regression, displacement vectors pointing from the center of image patches towards landmark locations are determined. In classification, presence of landmarks of interest in the patch is established. Global landmark locations are obtained by averaging the predicted displacement vectors, where the contribution of each displacement vector is weighted by the posterior classification probability of the patch that it is pointing from. Subsequently, for each landmark localized with global localization, local analysis is performed. Specialized FCNNs refine the global landmark locations by analyzing local sub-images in a similar manner, i.e. by performing regression and classification simultaneously and combining the results. Evaluation was performed through localization of 8 anatomical landmarks in CCTA scans, 2 landmarks in olfactory MR scans, and 19 landmarks in cephalometric X-rays. We demonstrate that the method performs similarly to a second observer and is able to localize landmarks in a diverse set of medical images, differing in image modality, image dimensionality, and anatomical coverage.
Comment: 12 pages, accepted at IEEE transactions in Medical Imaging
Databáze: OpenAIRE