Universal test system for system embedded optical interconnect
| Autor: | K. Wang, Marcel Neitz, Marika Immonen, Richard Pitwon, Henning Schröder |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
020205 medical informatics
Test design business.industry Computer science System of measurement Optical interconnect 02 engineering and technology Test (assessment) Printed circuit board 020210 optoelectronics & photonics 0202 electrical engineering electronic engineering information engineering Transceiver business Interlocking Computer hardware Optical connectors |
| Zdroj: | Optical Interconnects XVIII |
| DOI: | 10.1117/12.2289590 |
| Popis: | We introduce a universal test and measurement system allowing comparative characterisation of optical transceivers, board-to-board optical connectors and both embedded and passive optical circuit boards. The system comprises a test enclosure with interlocking and interchangeable test cards, allowing different technologies spanning different Technology Readiness Levels to be both characterised alone and in combination with other technologies. They form part of the open test design standards portfolio developed on the FP7 PhoxTroT and H2020 COSMICC projects and allow testing on a common test platform. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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