Smart Attendance Monitoring Technology for Industry 4.0

Autor: Archana S. Nadhan, Chetana Tukkoji, Boosi Shyamala, N. Dayanand Lal, A. N. Sanjeev Kumar, V. Mohan Gowda, Zameer Ahmed Adhoni, Melaku Endaweke
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Journal of Nanomaterials.
ISSN: 1687-4110
DOI: 10.1155/2022/4899768
Popis: Keeping track of employee attendance in academic settings can be a difficult task. It frequently wastes a significant percentage of the category’s productive time when done manually. In this study, the OpenCV open-source image processing library presents an effective Raspberry Pi-based methodology that reduces product cost and aids in connecting to heterogeneous devices for attendance. When teaching and testing and collecting employee photos and taking attendance, the system delivers a user-friendly interface that maximizes the user experience. Face detection and recognition are done with LBP histograms, and the database is updated with SQLite (a lightweight version of SQL for the Raspberry Pi) rather than MySQL.
Databáze: OpenAIRE
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