Metrology for industrial quantum communications: the MIQC project

Autor: Maria Luisa Rastello, Alberto Tosi, Fabrizio Piacentini, Alice Meda, Christopher J. Chunnilall, Ivo Pietro Degiovanni, Paolo Traina, Geiland Porrovecchio, Toomas Kübarsepp, Giorgio Brida, Kee-Suk Hong, Seung Kwan Kim, Alistar G. Sinclair, A.Al. Natsheh, Farshid Manoocheri, Aigar Vaigu, Stefan Kück, Ingmar Müller, Roman Klein, Jessica Y. Cheung, Erkki Ikonen, Marek Smid, Damien Stucki
Rok vydání: 2014
Předmět:
Zdroj: Metrologia. 51:S267-S275
ISSN: 1681-7575
0026-1394
Popis: The ?Metrology for Industrial Quantum Communication Technologies? project (MIQC) is a metrology framework that fosters development and market take-up of quantum communication technologies and is aimed at achieving maximum impact for the European industry in this area.MIQC is focused on quantum key distribution (QKD) technologies, the most advanced quantum-based technology towards practical application. QKD is a way of sending cryptographic keys with absolute security. It does this by exploiting the ability to encode in a photon's degree of freedom specific quantum states that are noticeably disturbed if an eavesdropper trying to decode it is present in the communication channel. The MIQC project has started the development of independent measurement standards and definitions for the optical components of QKD system, since one of the perceived barriers to QKD market success is the lack of standardization and quality assurance.
Databáze: OpenAIRE