Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes
| Autor: | Jose Silva-Martinez, Xavier Perpiñà, Eduardo Aldrete-Vidrio, Xavier Jordà, Josep Altet, Didac Gómez, Ferran Reverter, Haralampos-G. Stratigopoulos, Baudouin Martineau, Miquel Vellvehi, Louay Abdallah, Xavier Aragones, Stefan Dilhaire, Salvador Mir, Diego Mateo, José Luis González, Marvin Onabajo |
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| Přispěvatelé: | Electronic Engineering Department, Universitat Politècnica de Catalunya [Barcelona] (UPC), Analog and Mixed Signal Center (AMSC), Texas A&M University [College Station], STMicroelectronics, Centre Nacional de Microelectrònica (CNM), Universitat Autònoma de Barcelona (UAB), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Laboratoire Ondes et Matière d'Aquitaine (LOMA), Université de Bordeaux (UB)-Centre National de la Recherche Scientifique (CNRS), Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions, Universitat Politècnica de Catalunya. e-CAT - Circuits i Transductors Electrònics, Universitat Autònoma de Barcelona [Barcelona] (UAB), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Centre National de la Recherche Scientifique (CNRS)-Université de Bordeaux (UB) |
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
Engineering
Silicon Amplificadors de potència Elemental semiconductors Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica [Àrees temàtiques de la UPC] Millimetre wave circuits 01 natural sciences temperature sensors Enginyeria electrònica::Instrumentació i mesura::Sensors i actuadors [Àrees temàtiques de la UPC] Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering Calibration Electronic engineering Temperature sensors [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Electronic circuit Termometria -- Aparells i instruments business.industry Power amplifiers 010401 analytical chemistry 020206 networking & telecommunications built in testing Temperature measuring instruments 0104 chemical sciences Built-in self test Built-in self-test Circuit testing PACS 85.40 business Circuit under test |
| Zdroj: | 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14) 57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), Aug 2014, Texas, United States. pp.1081-1084, ⟨10.1109/MWSCAS.2014.6908606⟩ UPCommons. Portal del coneixement obert de la UPC Universitat Politècnica de Catalunya (UPC) Recercat. Dipósit de la Recerca de Catalunya Universitat Jaume I MWSCAS |
| Popis: | International audience; This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The strategy is to embed small temperature sensors on the same silicon die as the circuit under test, taking advantage of empty spaces in the layout. This paper reviews the physical principles, and presents examples that reveal how temperature sensors can be used as functional built-in testers serving to reduce testing costs and enhance yield as part of self-healing strategies. |
| Databáze: | OpenAIRE |
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