Comparison of AWGs and Echelle Gratings for Wavelength Division Multiplexing on Silicon-on-Insulator
| Autor: | Shibnath Pathak, Wim Bogaerts, D. Van Thourhout, Pieter Dumon |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
lcsh:Applied optics. Photonics
Demultiplexer Materials science Silicon business.industry chemistry.chemical_element Silicon on insulator lcsh:TA1501-1820 AWG Multiplexer Atomic and Molecular Physics and Optics Crosstalk Optics CMOS chemistry Wavelength-division multiplexing Insertion loss lcsh:QC350-467 Electrical and Electronic Engineering business lcsh:Optics. Light |
| Zdroj: | IEEE Photonics Journal, Vol 6, Iss 5, Pp 1-9 (2014) |
| ISSN: | 1943-0655 |
| Popis: | We compare the performance (insertion loss and crosstalk) of silicon-based arrayed waveguide gratings (AWGs) and echelle gratings for different channel spacings. For high-resolution de/multiplexer (DWDM) applications, AWGs are the better choice, whereas echelle gratings perform well for low-resolution de/multiplexer (CWDM) applications. Alternatively, for low-resolution de/multiplexer applications, the conventional box-shaped silicon AWG can be modified by an S-shaped AWG. We report crosstalk as low as -27 dB for regular AWGs, whereas in the S-shaped AWGs, the crosstalk is better than -19 dB, with an insertion loss below -2 dB. The crosstalk of the echelle gratings varies between -19 and -23 dB, with insertion loss below -2 dB. |
| Databáze: | OpenAIRE |
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