Loss mechanisms in superconducting thin film microwave resonators
| Autor: | M. Haeberlein, Christoph W. Zollitsch, Edwin P. Menzel, F. Wulschner, P. Eder, Jan Goetz, Frank Deppe, A. Marx, Michael Fischer, Rudolf Gross, Kirill G. Fedorov, Sebastian Meier, E. Xie |
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| Rok vydání: | 2016 |
| Předmět: |
Josephson effect
Materials science Niobium FOS: Physical sciences General Physics and Astronomy chemistry.chemical_element 02 engineering and technology Substrate (electronics) 01 natural sciences Superconductivity (cond-mat.supr-con) Resonator Mesoscale and Nanoscale Physics (cond-mat.mes-hall) 0103 physical sciences Thin film 010306 general physics Superconductivity Condensed Matter - Mesoscale and Nanoscale Physics business.industry Condensed Matter - Superconductivity Coplanar waveguide 021001 nanoscience & nanotechnology chemistry Optoelectronics 0210 nano-technology business Microwave |
| Zdroj: | Journal of Applied Physics. 119:015304 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.4939299 |
| Popis: | We present a systematic analysis of the internal losses of superconducting coplanar waveguide microwave resonators based on niobium thin films on silicon substrates. In particular, we investigate losses introduced by Nb/Al interfaces in the center conductor, which is important for experiments where Al based Josephson junctions are integrated into Nb based circuits. We find that these interfaces can be a strong source for two-level state (TLS) losses, when the interfaces are not positioned at current nodes of the resonator. In addition to TLS losses, for resonators including Al, quasiparticle losses become relevant above 200 mK. Finally, we investigate how losses generated by eddy currents in conductive material on the backside of the substrate can be minimized by using thick enough substrates or metals with high conductivity on the substrate backside. |
| Databáze: | OpenAIRE |
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