Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser
| Autor: | Frank Siewert, Iwanna Jacyna, Jaromír Chalupský, Robbert Wilhelmus Elisabeth van de Kruijs, Nikita Medvedev, Ryszard Sobierajski, Elke Plönjes, Igor Alexandrovich Makhotkin, Fred Bijkerk, Barbara Keitel, R.A. Loch, Gosse de Vries, V. Vozda, Bart Faatz, Han-Kwang Nienhuys, Tomáš Burian, Grzegorz Gwalt, Igor Milov, Tobias Mey, Eric Louis, Siegfried Schreiber, Sebastian Strobel, Martin Hermann, Michael Störmer, Jacobus Marinus Sturm, Věra Hájková, Kai Tiedtke, Hartmut Enkisch, Karel Saksl, Sven Toleikis, Vladimir Lipp, Marek Jurek, Libor Juha |
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| Přispěvatelé: | XUV Optics |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Materials science
business.industry Free-electron laser Context (language use) 02 engineering and technology 021001 nanoscience & nanotechnology Laser 01 natural sciences Atomic and Molecular Physics and Optics FEL single shot damage ruthenium film femtosecond law.invention Optics law Extreme ultraviolet 0103 physical sciences Femtosecond Spallation ddc:530 Thin film 010306 general physics 0210 nano-technology business Ultrashort pulse |
| Zdroj: | Optics express 26(15), 19665-19685 (2018). doi:10.1364/OE.26.019665 Optics express, 26(15), 19665-19685. The Optical Society Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupský, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. In: Optics express. Vol. 26 (2018) 15, 19665-19685. (DOI: /10.1364/OE.26.019665) |
| ISSN: | 1094-4087 |
| DOI: | 10.3204/pubdb-2018-05845 |
| Popis: | Optics express 26(15), 19665 - 19685 (2018). doi:10.1364/OE.26.019665 Ruthenium is a perspective material to be used for XUV mirrors at free-electron laser facilities. Yet, it is still poorly studied in the context of ultrafast laser-matter interaction. In this work, we present single-shot damage studies of thin Ru films irradiated by femtosecond XUV free-electron laser pulses at FLASH. Ex-situ analysis of the damaged spots, performed by different types of microscopy, shows that the weakest detected damage is surface roughening. For higher fluences we observe ablation of Ru. Combined simulations using Monte-Carlo code XCASCADE(3D) and the two-temperature model reveal that the damage mechanism is photomechanical spallation, similar to the case of irradiating the target with optical lasers. The analogy with the optical damage studies enables us to explain the observed damage morphologies. Published by OSA, Washington, DC |
| Databáze: | OpenAIRE |
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