Optical properties of thermally evaporated PDI-8CN2 thin films

Autor:	Mohan V. Jacob, F. V. Di Girolamo, Mario Barra, Liam J. Anderson, Antonio Cassinese
Přispěvatelé:	L., Anderson, F., Di Girolamo, M., Barra, Cassinese, Antonio, M. V., Jacob
Rok vydání:	2011
Předmět:	Optical Anisotropy Ellipsometry Materials science business.industry Physics::Optics Dielectric Physics and Astronomy(all) Molar absorptivity chemistry.chemical_compound Optics chemistry Optoelectronics Spectroscopic ellipsometry Thin film business Anisotropy Perylene Refractive index
Zdroj:	Physics Procedia. 14:29-33
ISSN:	1875-3892
Popis:	The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44431fcd1c9a49185af79aab1bf2678b https://doi.org/10.1016/j.phpro.2011.05.007 Zobrazit plný text záznamu