Material-specific infrared recognition of single sub-10 nm particles by substrate-enhanced scattering-type near-field microscopy
Autor: | A. Cvitkovic, Rainer Hillenbrand, Nenad Ocelic |
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Rok vydání: | 2007 |
Předmět: |
Materials science
Nanostructure Light Infrared Infrared Rays Macromolecular Substances Surface Properties Analytical chemistry Molecular Conformation Physics::Optics Nanoparticle Bioengineering Dielectric Substrate (electronics) law.invention Optical microscope law Image Interpretation Computer-Assisted Materials Testing Nanotechnology Scattering Radiation General Materials Science Particle Size Microscopy business.industry Scattering Mechanical Engineering General Chemistry Condensed Matter Physics Nanostructures Refractometry Optoelectronics Near-field scanning optical microscope business |
Zdroj: | Nano letters. 7(10) |
ISSN: | 1530-6984 |
Popis: | We study the optical material contrast of single nanoparticles in infrared scattering-type near-field optical microscopy (IR s-SNOM) in the presence of strong probe-substrate coupling. It is shown theoretically and experimentally that the contrast depends on both the dielectric properties of the nanoparticles and on their size. We can separate the two dependencies by correlating the simultaneously acquired topography and near-field images pixel-by-pixel. This allows us to establish material-specific mapping of polydisperse nanoparticle mixtures with nanoscale spatial resolution. We experimentally demonstrate the differentiation between sub-10 nm gold and polymer particles adsorbed on a Si substrate. Possible applications of our method range from the material-specific mapping of nanoparticle assemblies to the measurement of the doping concentration in single semiconductor nanoparticles. |
Databáze: | OpenAIRE |
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