Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter
| Autor: | Jessy Clédière, Bruno Robisson, Loic Zussa, Jean-Max Dutertre |
|---|---|
| Přispěvatelé: | Département Systèmes et Architectures Sécurisés (SAS-ENSMSE), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Systèmes et Architectures Sécurisés (LSAS), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC-École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-CMP-GC-CEA Tech en régions (CEA-TECH-Reg), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)) |
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
Engineering
field-programmable gate array business.industry Electrical engineering Fault Injection Fault injection Hardware_PERFORMANCEANDRELIABILITY Power (physics) Mechanism (engineering) [SPI]Engineering Sciences [physics] Voltmeter on chip voltmeter power supply glitch Electronic engineering CPU core voltage [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics business Field-programmable gate array FPGA Voltage Electronic circuit |
| Zdroj: | IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST) IEEE Int. Symposium on Hardware-Oriented Security and Trust (HOST), May 2014, Arlington, France. ⟨10.1109/HST.2014.6855583⟩ HOST |
| DOI: | 10.1109/HST.2014.6855583⟩ |
| Popis: | International audience; Power supply underpowering and negative power supply glitches are commonly used for the purpose of injecting faults into secure circuits. The related fault injection mechanism has been extensively studied: it is based on setup time violations. Positive power supply glitches are also used to inject faults. However, an increase of the supply voltage is not consistent with a mechanism based on setup time violation. Besides, no research work has yet identified the corresponding mechanism. In this work, we report the use of an embedded delay-meter to monitor the core voltage of a programmable device exposed to power supply glitches. It permitted us to gain a further insight into the mechanism associated with power glitches and also to identify the injection mechanism of positive power supply glitches. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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