A multiline InP-TRL kit for sub-mmWave characterization of InP-HEMT
| Autor: | R. Younes, N. Wichmann, S. Lepilliet, G. Ducournau, S. Bollaert |
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| Přispěvatelé: | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Advanced NanOmeter DEvices - IEMN (ANODE - IEMN), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Plateforme de Caractérisation Multi-Physiques - IEMN (PCMP - IEMN), Photonique THz - IEMN (PHOTONIQUE THZ - IEMN), no information, PCMP CHOP |
| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Aug 2022, Delft, Netherlands. pp.1-2, ⟨10.1109/IRMMW-THz50927.2022.9895722⟩ |
| DOI: | 10.1109/IRMMW-THz50927.2022.9895722⟩ |
| Popis: | International audience; We investigate the development of on-wafer multiline Thru-Reflect-Line calibration kits to enable transistor characterization beyond 110 GHz. The final objective is to measure the S parameters of a HEMT having a very high cut-off frequency (up to THz range). A first kit design shows that the use of configurations suitable for the frequency bands used in the calibration will optimize the measurements of THz transistors. |
| Databáze: | OpenAIRE |
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