Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy

Autor:	Bastian Barton, Hector A. Calderon, Christian Kisielowski, Robert C. Cieslinski, Joo Kang, Petra Specht, S.M. Gygax
Rok vydání:	2015
Předmět:	Length scale business.industry Chemistry Resolution (electron density) General Physics and Astronomy Cell Biology Electron Molecular physics Optics Structural Biology Atom Cathode ray General Materials Science business High-resolution transmission electron microscopy Excitation Beam (structure)
Zdroj:	Micron. 68:186-193
ISSN:	0968-4328
Popis:	This contribution touches on essential requirements for instrument stability and resolution that allows operating advanced electron microscopes at the edge to technological capabilities. They enable the detection of single atoms and their dynamic behavior on a length scale of picometers in real time. It is understood that the observed atom dynamic is intimately linked to the relaxation and thermalization of electron beam-induced sample excitation. Resulting contrast fluctuations are beam current dependent and largely contribute to a contrast mismatch between experiments and theory if not considered. If explored, they open the possibility to study functional behavior of nanocrystals and single molecules at the atomic level in real time.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41cd4eba7083521b8b5e117d174d3dcf https://doi.org/10.1016/j.micron.2014.07.010 Zobrazit plný text záznamu Full Text from ScienceDirect