True Non-Intrusive Sensors for RF Built-In Test
| Autor: | Haralampos-G. Stratigopoulos, Salvador Mir, Louay Abdallah |
|---|---|
| Přispěvatelé: | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA) |
| Jazyk: | angličtina |
| Rok vydání: | 2013 |
| Předmět: |
Test strategy
Engineering business.industry Microsystem Testing temperature-sensors 020208 electrical & electronic engineering Electrical engineering 02 engineering and technology Sense (electronics) built-in self test 020202 computer hardware & architecture Test (assessment) Set (abstract data type) Built-in self-test PACS 85.42 0202 electrical engineering electronic engineering information engineering Key (cryptography) Electronic engineering [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics business Design methods Electronic circuit |
| Zdroj: | IEEE International Test Conference (ITC'13) IEEE International Test Conference (ITC'13), Sep 2013, Anaheim, CA, United States. pp.1_10, ⟨10.1109/TEST.2013.6651885⟩ ITC |
| Popis: | International audience; In this summary paper, we discuss two types of sensors that provide a built-in test solution for RF circuits. The key characteristic of the sensors is that they are non-intrusive, in the sense that they are not electrically connected to the RF circuit under test. This has the important advantage that the design of the RF circuit becomes totally independent from the design of the sensors. In other words, the RF circuit design methodology and performance trade-offs are totally transparent to the insertion of the built-in test strategy. In particular, we propose variation-aware sensors to implement an implicit functional test and a temperature sensor to implement a defect-oriented test. The proposed sensors provide DC or low-frequency measurements, thus they have the potential to reduce drastically the test cost. We discuss the principle of operation of the sensors, we provide design guidelines, and we demonstrate the concept on a set of fabricated chips. To the best of our knowledge, this is the first proof-of-concept of RF test based on non-intrusive sensors. |
| Databáze: | OpenAIRE |
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