A New Nanospectroscopy Tool with Synchrotron Radiation : NanoESCA@Elettra
| Autor: | Nils Weber, M. Escher, I. P. Krug, M. Merkel, Marten Patt, C. Wiemann, Claus M. Schneider |
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| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Předmět: |
Spectrum analyzer
Microscope Materials science business.industry Resolution (electron density) Synchrotron radiation Bioengineering Surfaces and Interfaces Lateral resolution Synchrotron radiation photoelectron spectroscopy Physik (inkl. Astronomie) Condensed Matter Physics Surfaces Coatings and Films law.invention Lens (optics) Optics Beamline Mechanics of Materials law business Biotechnology |
| Popis: | We describe first experiences with a novel spectromicroscopy set-up — NanoESCA@Elettra — which has been installed at the nanospectroscopy soft x-ray beamline at Elettra (Trieste). The system features an energy-filtered photoemission microscope with a 30 kV immersion lens system and a double-hemispherical energy analyzer. The instrument provides both real space and k-space mapping modes. Experiments on nanostructured samples with laboratory gas discharge sources show a lateral resolution of less than 50 nm and an energy resolution of better than 200 meV. We have also performed first tests of the instrument with synchrotron radiation. [DOI: 10.1380/ejssnt.2011.395] |
| Databáze: | OpenAIRE |
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