Experimental setup to monitor non-destructive single events triggered by ionizing radiation in power devices
| Autor: | Mauro Ciappa, Marco Pocaterra |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Ionizing radiation
Cosmic ray 02 engineering and technology 01 natural sciences Ionization 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electronic engineering Terrestrial cosmic radiation Waveform Power semiconductor device Charge spectrometry Electrical and Electronic Engineering Safety Risk Reliability and Quality 010302 applied physics Physics Spectrometer Event (computing) 020208 electrical & electronic engineering Ranging Condensed Matter Physics Atomic and Molecular Physics and Optics Power devices Surfaces Coatings and Films Electronic Optical and Magnetic Materials |
| Zdroj: | Microelectronics Reliability, 114 |
| ISSN: | 0026-2714 1872-941X |
| DOI: | 10.3929/ethz-b-000448150 |
| Popis: | A dedicated experimental setup is presented for the acquisition of single ionization events generated in power devices by ionizing radiation. This spectrometer chain is designed to be used for long-term experiments, where devices are submitted to the natural terrestrial cosmic radiation (TCR), for TCR characterizations, as well as in conjunction with radioactive sources. Every single ionization event that generates in the device charge pulses ranging from 1 fC up to 2 pC is recorded together with its time stamp and waveform. Original noise filtering and pile-up rejection strategies are implemented. The dedicated hardware and software are described in very detail in conjunction with the main operating procedures. Microelectronics Reliability, 114 ISSN:0026-2714 ISSN:1872-941X |
| Databáze: | OpenAIRE |
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