Fundamental research for a new confocal line X-ray spectrometer

Autor:	Shintaro Komatani, Kouichi Tsuji, Shota Sonoda, Hitomi Nakano, Tsugufumi Matsuyama
Jazyk:	angličtina
Rok vydání:	2021
Předmět:	X-ray spectroscopy Optics Materials science business.industry Confocal Micro XRF Depth analysis Non-destructive analysis Line (text file) Confocal line XRF business Spectroscopy
Zdroj:	X-RAY SPECTROMETRY. 50(3):224-230
ISSN:	1097-4539
Popis:	Confocal X-ray fluorescence (XRF) spectrometry can be used to perform three-dimensional elemental analysis, which is impossible using general micro XRF spectrometry without any collimating optics in the detection channel. In this study, we designed, for the first time, a new confocal line XRF (C-L-XRF) system that can obtain elemental information of a larger area and higher intensity in XRF analysis than conventional confocal point XRF (C-P-XRF) analysis....
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4058cbb117465e5d2833b8eb6186b758 https://dlisv03.media.osaka-cu.ac.jp/il/meta_pub/G0000438repository_10974539-50-3-224 Zobrazit plný text záznamu Plný text