Microwave Imaging Profilometry for Plasma Diagnostics
| Autor: | N. Prabagarane, K. Shruthi, Gino Sorbello, Giuseppe Torrisi, L. Di Donato, David Mascali |
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| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
sparsity optimization techniques
Materials science microwave imaging profilometry business.industry 020208 electrical & electronic engineering Non invasive Experimental data 020206 networking & telecommunications Astrophysics::Cosmology and Extragalactic Astrophysics 02 engineering and technology Plasma Frequency difference Microwave imaging Optics electromagnetic inverse scattering Inverse scattering problem 0202 electrical engineering electronic engineering information engineering Plasma diagnostics microwave plasma diagnostics Profilometer business |
| Popis: | Microwave imaging can provide effective means for non invasive electromagnetic diagnostics of plasma showing several advantages with respect to traditional techniques. Although microwave imaging entails solution of a full wave inverse scattering problem, it can be addressed in a less complex (but not simpler) way considering the one-dimensional inverse scattering problem for microwave imaging profilometry (MIP). In this contribution, we describe a frequency difference domain approach for MIP and provide a possible 3D full wave experimental setup in order to make a step forward application of MIP against laboratory experimental data. |
| Databáze: | OpenAIRE |
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