Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM

Autor:	Rafal E. Dunin-Borkowski, Ryusuke Sagawa, Martin Simson, Martin Huth, Robert Hartmann, H. Ryll, Vadim Migunov, Peter D. Nellist, Lothar Strüder, Heike Soltau, Yukihito Kondo, Robert Ritz, Hao Yang, Julia Schmidt, Lewys Jones, Sebastian Ihle
Jazyk:	angličtina
Rok vydání:	2016
Předmět:	Materials science ddc:570 0202 electrical engineering electronic engineering information engineering 020201 artificial intelligence & image processing 02 engineering and technology Tomography 021001 nanoscience & nanotechnology 0210 nano-technology Instrumentation Biomedical engineering
Zdroj:	Microscopy and microanalysis 22(S3), 512-513 (2016). doi:10.1017/S143192761600341X Microscopy and Microanalysis, Columbus, OH, 2016-07-24-2016-07-28
DOI:	10.1017/S143192761600341X
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ef19d2d4c1b9e7651a79dd24db09ef6 https://juser.fz-juelich.de/record/827202 Zobrazit plný text záznamu