'PARS'—A Portable X-Ray Analyzer for Residual Stresses
| Autor: | RT Horstman, KC Lieb, RL Meltzer, IC Moore, M James, JB Cohen |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 1978 |
| Předmět: |
Spectrum analyzer
Materials science Orientation (computer vision) business.industry Mechanical Engineering Detector Stress (mechanics) Generator (circuit theory) Optics Mechanics of Materials Residual stress Electronic engineering General Materials Science Tube (fluid conveyance) business Diffractometer |
| Zdroj: | Journal of testing and evaluation, 6(2), 91-97 |
| ISSN: | 0090-3973 |
| Popis: | The design, operation, and testing of a 7 to 11-kg hand-held X-ray device for measuring residual stresses are described. The instrument is based on a miniature X-ray tube and generator and a position-sensitive detector. No motion of the detector is needed to record a peak, eliminating the expensive and heavy gearing characteristic of a conventional diffractometer; the only mechanical motion during a measurement is one change of the orientation of the device to the object. An entirely portable instrument is therefore available for use in the plant or in the field. Tests are reported in which the stress is measured to ±40 MPa (± 6 ksi) or better in 4 to 20 s, depending on the specimen. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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