Automatic software fault localization using generic program invariants
| Autor: | Peter Zoeteweij, Rui Abreu, A. Gonzalez, Arjan J. C. van Gemund |
|---|---|
| Rok vydání: | 2008 |
| Předmět: |
Computer science
Real-time computing 020206 networking & telecommunications 020207 software engineering 02 engineering and technology Fault (power engineering) Execution time Set (abstract data type) Range (mathematics) Test case Computer engineering 0202 electrical engineering electronic engineering information engineering Overhead (computing) Dependability |
| Zdroj: | SAC |
| DOI: | 10.1145/1363686.1363855 |
| Popis: | Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of low-cost, generic invariants ("screeners") in their capacity of error detectors within a spectrum-based fault localization (SFL) approach aimed to diagnose program defects in the operational phase. The screeners considered are simple bit-mask and range invariants that screen every load/store and function argument/return program point. Their generic nature allows them to be automatically instrumented without any programmer-effort, while training is straightforward given the test cases available in the development phase. Experiments based on the Siemens program set demonstrate diagnostic performance that is similar to the traditional, development-time application of SFL based on the program pass/fail information known before-hand. This diagnostic performance is currently attained at an average 14% screener execution time overhead, but this overhead can be reduced at limited performance penalty. |
| Databáze: | OpenAIRE |
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