Multiscale roughness analysis of engineering surfaces: A comparison of methods for the investigation of functional correlations
Autor: | Maxence Bigerelle, Gaëtan Le Goïc, Maurice Pillet, Hugues Favreliere, Serge Samper |
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Přispěvatelé: | Laboratoire Electronique, Informatique et Image ( Le2i ), Université de Bourgogne ( UB ) -AgroSup Dijon - Institut National Supérieur des Sciences Agronomiques, de l'Alimentation et de l'Environnement-Centre National de la Recherche Scientifique ( CNRS ), Laboratoire d'automatique et de mécanique industrielles et humaines ( LAMIH ), Université de Valenciennes et du Hainaut-Cambresis ( UVHC ) -Centre National de la Recherche Scientifique ( CNRS ), Institut de Physique de Rennes ( IPR ), Université de Rennes 1 ( UR1 ), Université de Rennes ( UNIV-RENNES ) -Université de Rennes ( UNIV-RENNES ) -Centre National de la Recherche Scientifique ( CNRS ), Laboratoire SYstèmes et Matériaux pour la MEcatronique ( SYMME ), Université Savoie Mont Blanc ( USMB [Université de Savoie] [Université de Chambéry] ), Laboratoire Electronique, Informatique et Image [UMR6306] (Le2i), Université de Bourgogne (UB)-Centre National de la Recherche Scientifique (CNRS)-École Nationale Supérieure d'Arts et Métiers (ENSAM), Arts et Métiers Sciences et Technologies, HESAM Université (HESAM)-HESAM Université (HESAM)-Arts et Métiers Sciences et Technologies, HESAM Université (HESAM)-HESAM Université (HESAM)-AgroSup Dijon - Institut National Supérieur des Sciences Agronomiques, de l'Alimentation et de l'Environnement, Laboratoire d'Automatique, de Mécanique et d'Informatique industrielles et Humaines - UMR 8201 (LAMIH), Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Centre National de la Recherche Scientifique (CNRS)-INSA Institut National des Sciences Appliquées Hauts-de-France (INSA Hauts-De-France), Laboratoire SYstèmes et Matériaux pour la MEcatronique (SYMME), Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry]) |
Rok vydání: | 2016 |
Předmět: |
Discrete wavelet transform
0209 industrial biotechnology Gaussian Aerospace Engineering 02 engineering and technology Surface finish [SPI]Engineering Sciences [physics] symbols.namesake 020901 industrial engineering & automation Wavelet Fractal 0203 mechanical engineering [ SPI ] Engineering Sciences [physics] Computer vision Civil and Structural Engineering Mathematics business.industry Mechanical Engineering Wavelet transform Filter (signal processing) Computer Science Applications 020303 mechanical engineering & transports Modal Control and Systems Engineering Signal Processing symbols Artificial intelligence business Biological system |
Zdroj: | Mechanical Systems and Signal Processing Mechanical Systems and Signal Processing, Elsevier, 2015, 66-67, pp.437-457. 〈10.1016/j.ymssp.2015.05.029〉 Mechanical Systems and Signal Processing, Elsevier, 2016, 66-67, pp.437-457. ⟨10.1016/j.ymssp.2015.05.029⟩ |
ISSN: | 0888-3270 1096-1216 |
Popis: | This study investigates the correlations between the topography of different damaged rough surfaces and process conditions. Several surfaces are measured and compared to determine if they can be discriminated. The analysis is performed by using Gaussian Filtering, Wavelet Transform and a more recent approach named Discrete Modal Decomposition. Standardized 3D roughness parameters are computed for each multiscale method, filter (e.g., high-pass, low-pass and band-pass) and available scale. The relevance (i.e., the ability to discriminate surface topographies corresponding to different process conditions) is then investigated using a statistical analysis based on the MesRugTM expert system. The results indicate clear differences between the multiscale methods and show that the Wavelet approach is useful when characterizing localized surface defects while Gaussian Filtering is more appropriate for highly periodic morphological structures. For more complex topographies, this study also clearly shows that the Discrete Modal Decomposition exhibits compelling abilities that fall between those of the Gaussian and Wavelet approaches; this method is clearly more relevant than the Gaussian method in the case of localized defects and less relevant in the case of highly periodical structures and fractal surfaces ( 1 / f α spectrum). This can be explained by the modulated frequency/amplitude descriptors generated via the modal basis. |
Databáze: | OpenAIRE |
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