Optimization of layered synthetic microstructures for broadband reflectivity at soft x-ray and EUV wavelengths

Autor:	John F. Meekins, Raymond G. Cruddace, Herbert Gursky
Rok vydání:	2010
Předmět:	Materials Science (miscellaneous) Business and International Management Industrial and Manufacturing Engineering
Zdroj:	Applied optics. 26(6)
ISSN:	1559-128X
Popis:	A technique is described which allows the thickness of each layer in a layered synthetic microstructure to yield a useful constant efficiency over a broad band of wavelengths, several hundred angstroms wide, in the soft x-ray and EUV wave bands.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3c7497070f198c6cfe2865b62bb48c38 https://pubmed.ncbi.nlm.nih.gov/20454257 Zobrazit plný text záznamu