Infrared-spectroscopic nanoimaging with a thermal source
| Autor: | Florian Huth, Nenad Ocelic, J. Wittborn, Martin Schnell, Rainer Hillenbrand |
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| Rok vydání: | 2011 |
| Předmět: |
Materials science
Spectrometer business.industry Infrared Mechanical Engineering Resolution (electron density) Astrophysics::Cosmology and Extragalactic Astrophysics General Chemistry Condensed Matter Physics Optics Mechanics of Materials Thermal radiation Thermal infrared spectroscopy Optoelectronics General Materials Science Physics::Chemical Physics Fourier transform infrared spectroscopy business Spectroscopy Image resolution Astrophysics::Galaxy Astrophysics |
| Zdroj: | Nature materials. 10(5) |
| ISSN: | 1476-4660 |
| Popis: | Fourier-transform infrared (FTIR) spectroscopy is a widely used analytical tool for chemical identification of inorganic, organic and biomedical materials, as well as for exploring conduction phenomena. Because of the diffraction limit, however, conventional FTIR cannot be applied for nanoscale imaging. Here we demonstrate a novel FTIR system that allows for infrared-spectroscopic nanoimaging of dielectric properties (nano-FTIR). Based on superfocusing of thermal radiation with an infrared antenna, detection of the scattered light, and strong signal enhancement employing an asymmetric FTIR spectrometer, we improve the spatial resolution of conventional infrared spectroscopy by more than two orders of magnitude. By mapping a semiconductor device, we demonstrate spectroscopic identification of silicon oxides and quantification of the free-carrier concentration in doped Si regions with a spatial resolution better than 100 nm. We envisage nano-FTIR becoming a powerful tool for chemical identification of nanomaterials, as well as for quantitative and contact-free measurement of the local free-carrier concentration and mobility in doped nanostructures. |
| Databáze: | OpenAIRE |
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