Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM$_{110}$ mode for ultrafast electron microscopy

Autor: O.J. Luiten, J.F.M. van Rens, A. Lassise, Peter H. A. Mutsaers, E. R. Kieft, J.G.H. Franssen, X. F. D. Stragier, W. Verhoeven
Přispěvatelé: Coherence and Quantum Technology, Center for Quantum Materials and Technology Eindhoven
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Zdroj: Ultramicroscopy, 184B, 77-89. Elsevier
ISSN: 0304-3991
Popis: We present a theoretical description of resonant radiofrequency (RF) deflecting cavities in TM$_{110}$ mode as dynamic optical elements for ultrafast electron microscopy. We first derive the optical transfer matrix of an ideal pillbox cavity and use a Courant-Snyder formalism to calculate the 6D phase space propagation of a Gaussian electron distribution through the cavity. We derive closed, analytic expressions for the increase in transverse emittance and energy spread of the electron distribution. We demonstrate that for the special case of a beam focused in the center of the cavity, the low emittance and low energy spread of a high quality beam can be maintained, which allows high-repetition rate, ultrafast electron microscopy with 100 fs temporal resolution combined with the atomic resolution of a high-end TEM. This is confirmed by charged particle tracking simulations using a realistic cavity geometry, including fringe fields at the cavity entrance and exit apertures.
Databáze: OpenAIRE