Laser Profiling for the Back-Side Fault Attacks

Autor: Chien-Ning Chen, Jakub Breier, Dirmanto Jap
Přispěvatelé: School of Physical and Mathematical Sciences, CPSS 2015 - Proceedings of the 1st ACM Workshop on Cyber-Physical System Security, Temasek Laboratories
Rok vydání: 2015
Předmět:
Zdroj: CPSS@ASIACSS
DOI: 10.1145/2732198.2732206
Popis: Laser fault injection is one of the strongest fault injection techniques. It offers a precise area positioning and a precise timing, allowing a high repeatability of experiments. In our paper we examine possibilities of laser-induced faults that could lead to instruction skips. After the profiling phase we were able to perform an attack on the last AddRoundKey operation in AES and to retrieve the secret key with just one faulty and correct ciphertext pair. Our experiments show very high degree of repeatability and 100% success rate with correct laser settings. Accepted version
Databáze: OpenAIRE