Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples
| Autor: | Xiao Yue Yang, Yu Chun Tu, Jing Tao Zhu, Wenbin Li, Zhan Shan Wang, Bao Zhong Mu, Xiang Jun Wei, Yu Ying Huang, Hai Sheng Yu |
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| Rok vydání: | 2013 |
| Předmět: |
X-ray reflectivity
Nuclear and High Energy Physics Radiation Materials science Reflection (mathematics) Extended X-ray absorption fine structure Surface-extended X-ray absorption fine structure Analytical chemistry X-ray fluorescence Absorption (electromagnetic radiation) Instrumentation Refraction X-ray absorption fine structure |
| Zdroj: | Journal of synchrotron radiation. 21(Pt 3) |
| ISSN: | 1600-5775 |
| Popis: | A novel correction method for self-absorption effects is proposed for extended X-ray absorption fine structure (EXAFS) detected in the fluorescence mode on multilayer samples. The effects of refraction and multiple reflection at the interfaces are fully considered in this correction method. The correction is performed ink-space before any further data analysis, and it can be applied to single-layer or multilayer samples with flat surfaces and without thickness limit when the model parameters for the samples are known. The validity of this method is verified by the fluorescence EXAFS data collected for a Cr/C multilayer sample measured at different experimental geometries. |
| Databáze: | OpenAIRE |
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