Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology
| Autor: | Robert L. Harniman, Paul W May, Oliver J. L. Fox |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Materials science
TUNA 02 engineering and technology Chemical vapor deposition Electron engineering.material 01 natural sciences Condensed Matter::Materials Science diamond Condensed Matter::Superconductivity 0103 physical sciences Materials Chemistry Surface roughness Electrical and Electronic Engineering Quantum tunnelling 010302 applied physics Condensed matter physics field emission Mechanical Engineering Diamond General Chemistry 021001 nanoscience & nanotechnology Electronic Optical and Magnetic Materials Field electron emission Crystallography engineering Grain boundary Crystallite 0210 nano-technology |
| Zdroj: | May, P, Harniman, R & Fox, O 2017, ' Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology ', Diamond and Related Materials, vol. 80, pp. 147-152 . https://doi.org/10.1016/j.diamond.2017.09.009 |
| ISSN: | 0925-9635 |
| DOI: | 10.1016/j.diamond.2017.09.009 |
| Popis: | We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect