Defect levels in Cu(In,Ga)Se2 polycrystalline layers by sub-bandgap photo-induced current transient spectroscopy
| Autor: | K. Macielak, Ludovic Arzel, Nicolas Barreau, P. Zabierowski, Malgorzata Igalson |
|---|---|
| Přispěvatelé: | Fac Phys - Univ Technol Warsaw, Univ. Technol. Warsaw, Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN) |
| Jazyk: | angličtina |
| Rok vydání: | 2015 |
| Předmět: |
Materials science
Band gap 02 engineering and technology Epitaxy 01 natural sciences chemistry.chemical_compound 0103 physical sciences Materials Chemistry ComputingMilieux_MISCELLANEOUS 010302 applied physics Photocurrent business.industry Metals and Alloys Surfaces and Interfaces 021001 nanoscience & nanotechnology Copper indium gallium selenide solar cells Surfaces Coatings and Films Electronic Optical and Magnetic Materials Wavelength chemistry [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] Optoelectronics Crystallite 0210 nano-technology business Copper indium gallium selenide Excitation |
| Zdroj: | Thin Solid Films Thin Solid Films, Elsevier, 2015, 582, pp.383-386. ⟨10.1016/j.tsf.2014.10.064⟩ |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2014.10.064⟩ |
| Popis: | Photoinduced current transient spectroscopy (PICTS) employing sub-bandgap excitation pulses is used for studying defect levels in polycrystalline thin films of Cu(In,Ga)Se 2 (CIGS). It is shown that the persistent photoconductivity effect accompanying photocurrent measurements distorts and often totally obscures PICTS spectra in the case of copper-poor polycrystalline layers. In order to overcome this difficulty, the use of sub-bandgap light in PICTS measurements is proposed. The results for both types of excitation – sub-bandgap (wavelength 1300 nm) and above bandgap (wavelength 975 nm) – are compared. We show that sub-bandgap light provides better-resolved PICTS spectra than in the case of standard measurements when contribution of photocurrent decay due to persistent photoconductivity is significant. The results for a set of CIGS polycrystalline layers fabricated using various preparation protocols are shown and discussed. Two most pronounced peaks are identified with transitions observed previously in the defect level spectra of the CuInSe 2 and CuGaSe 2 epitaxial layers. |
| Databáze: | OpenAIRE |
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